Author

Gilbert Seda

Postdoctoral Research Associate, Ulster University - Cited by 83 - VLSI - FPGAs - Digital Design - Fault tolerant design

Biography

Gilbert Seda is affiliated to Department of Pulmonary and Critical Care Medicine, Naval Medical Center San Diego. He is a recipient of many awards and grants for his valuable contributions and discoveries in major area of subject research. His international experience includes various programs, contributions and participation in different countries for diverse fields of study.  His research interests reflect in his wide range of publications in various national and international journals.  
Title
Cited by
Year
Understanding radiation effects in SRAM-based field programmable gate arrays for implementing instrumentation and control systems of nuclear power plants
TS Nidhin, A Bhattacharyya, RP Behera, T Jayanthi, K VelusamyNuclear Engineering and Technology 49 (8), 1589-1599, 2017201
40
2017
A review on SEU mitigation techniques for FPGA configuration memory
TS Nidhin, A Bhattacharyya, RP Behera, T JayanthiIETE Technical Review 35 (2), 157-168, 181
20
2018
Verification of fault tolerant techniques in finite state machines using simulation based fault injection targeted at FPGAs for SEU mitigation
TS Nidhin, A Bhattacharyya, RP Behera, T Jayanthi, K Velusamy2017 4th International Conference on Electronics and Communication Systems …, 2017201
9
2017
Dependable system design with soft error mitigation techniques in SRAM based FPGAs
TS Nidhin, A Bhattacharyya, RP Behera, T Jayanthi, K Velusamy2017 Innovations in Power and Advanced Computing Technologies (i-PACT), 1-6, 2017201
8
2017
SEU mitigation by golay code in the configuration memory of SRAM based FPGAs
TS Nidhin, A Bhattacharyya, RP Behera, T Jayanthi, K Velusamy016 International Conference on Control, Instrumentation, Communication and …, 01601
2
2016
Measurement of radiation absorbed dose effects in SRAM-based FPGAs
TS Nidhin, A Bhattacharyya, A Gour, RP Behera, T Jayanthi, K VelusamyIETE Journal of Research 68 (5), 348-3427, 2022202
1
2022