Author

Ijaz A Rauf

York University - Cited by 666 - Physics - NanoScience

Biography

He is currently working as a Professor in Physics. His research interests includes Physics. He is serving as an editorial member and reviewer of several international reputed journals. He has successfully completed his Administrative responsibilities. He has authored of many research articles/books related to Physics.
Title
Cited by
Year
Process for engineering coherent twin and coincident site lattice grain boundaries in polycrystalline materials
I RaufUS Patent 5,651,839, 1997199
119
1997
Structure and properties of tin‐doped indium oxide thin films prepared by reactive electron‐beam evaporation with a zone‐confining arrangement
IA RaufJournal of applied physics 79 (8), 4057-4065, 1996199
107
1996
Low resistivity and high mobility tin-doped indium oxide films
IA RaufMaterials Letters 18 (3), 123-127, 1993199
83
1993
Effects of oxygen partial pressure on the properties of reactively evaporated thin films of indium oxide
S Naseem, IA Rauf, K Hussain, NA MalikThin solid films 156 (1), 161-171, 1988198
81
1988
Dose-rate dependence of electron-induced mass loss from organic specimens
RF Egerton, I RaufUltramicroscopy 80 (4), 247-254, 1999199
52
1999
A novel method for preparing thin films with selective doping in a single evaporation step
IA RaufJournal of materials science letters 12 (24), 1902-1905, 1993199
52
1993
A review of materials selection for optimized efficiency in quantum dot sensitized solar cells: a simplified approach to reviewing literature data
IA Rauf, P RezaiRenewable and Sustainable Energy Reviews 73, 408-422, 2017201
24
2017
Effects of microstructure on the optical properties of tin-doped indium oxide thin films studied by electron energy loss spectroscopy
IA Rauf, J YuanMaterials letters 25 (5-6), 7-222, 1995199
21
1995
A comparative study of microstructure (in ITO films) and techniques (CTEM and STM)
IA Rauf, MG WallsUltramicroscopy 35 (1), 19-26, 1991199
16
1991
In situ study of amorphous to crystalline transition in indium oxide thin films using transmission electron microscopy
IA Rauf, LM BrownActa metallurgica et materialia 42 (1), 57-64, 1994199
16
1994
Extraction of free carrier density and mobility from the optical transmission data of tin-doped indium oxide thin films
IA RaufMaterials Letters 23 (1-3), 73-78, 1995199
15
1995
A comparison of scanning tunnelling microscopy with conventional and scanning transmission electron microscopy using tin-doped indium oxide thin films
IA RaufSurface science 325 (1-2), L413-L419, 1995199
8
1995
andP. H. Gaskell
IA Rauf, MG WallsTrans. R. Microsc. Soc 1, 165, 1990199
8
1990
The dominant scattering mechanisms in tin-doped indium oxide thin films
IA RaufJournal of Physics D: Applied Physics 27 (5), 103, 1994199
8
1994
Microstructural evolution during thermomechanical processing of a Ti-Nb interstitial-free steel just below the Ar 3 temperature
IA Rauf, JD BoydMetallurgical and Materials Transactions A 28, 143-1443, 19919
7
1997
A cross-correlation measure of order in “amorphous” indium oxide
JM Rodenburg, IA RaufInst Phys Conf Ser 98 (5), 119-122, 1989198
6
1989
Microstructure of amorphous indium oxide and tin oxide thin films
IA Rauf, LM BrownScripta metallurgica et materialia 30 (), 797-801, 1994199
6
1994
Direct observation of the birth of a nanocrystalline nucleus in an amorphous matrix
IA RaufApplied Physics Letters 93 (14), 2008200
6
2008
Applied Statistical Design of Experiments: Applications in Natural Sciences
IA RaufPhysical Chemistry and Biophysics (), 129-130, 20120
5
2015
Microscopy in solid state science
AJ McGibbon, LM Brown, AL Bleloch, ND Browning, ...Microscopy research and technique 24 (4), 299-31, 1993199
5
1993

Referred From: https://scholar.google.com/citations?hl=en&user=J-Si82QAAAAJ

Cited by
Citations 666
h-index 11
i10-index 11
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