Author

Taillon J

National Institute of Standard and Technology - Boulder, CO - Cited by 555 - Scientific data curation - Machine learning for materials - Materials microscopy - Open science - Data dissemination

Biography

Working at School of Hospitality, Food and Tourism Management, Place of living is  Canada. Subjects of Specialization are Interior design; Interpretive; Nature interpretation centre; Physical setting; Taman Wetland
Title
Cited by
Year
hyperspy/hyperspy: Release v1. 7.3
F De La Peña, E Prestat, V Tonaas Fauske, P Burdet, J Lähnemann, ...Zenodo, 2022195202
195
2022
Electron microscopy (big and small) data analysis with the open source software package HyperSpy
F de la Peña, T Ostasevicius, VT Fauske, P Burdet, P Jokubauskas, ...Microscopy and Microanalysis 23 (S1), 214-215, 2017201
76
2017
Near‐field optical properties of fully alloyed noble metal nanoparticles
C Gong, MRS Dias, GC Wessler, JA Taillon, LG Salamanca‐Riba, ...Advanced Optical Materials 5 (1), 1600568, 2017201
52
2017
Systematic structural and chemical characterization of the transition layer at the interface of NO-annealed 4H-SiC/SiO2 metal-oxide-semiconductor field-effect transistors
JA Taillon, J Hyuk Yang, CA Ahyi, J Rozen, JR Williams, LC Feldman, ...Journal of Applied Physics 113 (4), 2013201
46
2013
Improving microstructural quantification in FIB/SEM nanotomography
JA Taillon, C Pellegrinelli, Y Huang, ED Wachsman, LG Salamanca-RibaUltramicroscopy 184 (A), 24, 2018201
44
2018
Long-term Cr poisoning effect on LSCF-GDC composite cathodes sintered at different temperatures
C Xiong, JA Taillon, C Pellegrinelli, YL Huang, LG Salamanca-Riba, ...Journal of The Electrochemical Society 163 (9), F1091, 2016201
30
2016
Towards a fundamental understanding of the cathode degradation mechanisms
ED Wachsman, YL Huang, C Pellegrinelli, JA Taillon, ...ECS Transactions 61 (1), 47, 141
20
2014
Characterization of zinc carboxylates in an oil paint test panel
C Romano, T Lam, GA Newsome, JA Taillon, N Little, J TsangStudies in Conservation 65 (1), 14-27, 2020202
15
2020
Boron-doped few-walled carbon nanotubes: novel synthesis and properties
C Preston, D Song, JA Taillon, J Cumings, L HuNanotechnology 27 (44), 445601, 2016201
12
2016
Investigating the relationship between operating conditions and SOFC cathode degradation
C Pellegrinelli, YL Huang, JA Taillon, LG Salamanca-Riba, ...ECS Transactions 68 (1), 773, 2015201
10
2015
NexusLIMS: a laboratory information management system for shared-use electron microscopy facilities
JA Taillon, TF Bina, RL Plante, MW Newrock, GR Greene, JW LauMicroscopy and Microanalysis 27 (3), 511-527, 2021202
9
2021
Three dimensional microstructural characterization of cathode degradation in SOFCs using focused ion beam and SEM
JA Taillon, C Pellegrinelli, Y Huang, ED Wachsman, LG Salamanca-RibaECS Transactions 61 (1), 109, 2014201
7
2014
Hyperspy/hyperspy: Release v1. 6.1
Hyperspy/hyperspy: Release v1. .1FDL Peña, E Prestat, VT Fauske, P Burdet, T Furnival, P Jokubauskas, ...Zenodo. https://doi. org/10.5281/ZENODO, 2020202
6
2020
Analysis of the electronic and chemical structure in boron and phosphorus passivated 4H-SiC/SiO2 interfaces using HRTEM and STEM-EELS
JA Taillon, CJ Klingshirn, C Jiao, Y Zheng, S Dhar, TS Zheleva, AJ Lelis, ...Applied Physics Letters 113, 19303, 2018201
5
2018
A study of SOFC cathode degradation in H2O environments
C Pellegrinelli, YL Huang, JA Taillon, LG Salamanca-Riba, ...ECS Transactions 64 (2), 17, 2014201
5
2014
Characterization of the Oxide-Semiconductor Interface in 4H-SiC/SiO2 Structures using TEM and XPS
Characterization of the Oxide-Semiconductor Interface in H-SiC/SiO2 Structures using TEM and XPSJA Taillon, K Gaskell, G Liu, L Feldman, S Dahr, T Zheleva, A Lelis, ...Microscopy and Microanalysis 21, 1537, 2015201
4
2015
Harvesting microscopy experimental context with a configurable laboratory information management system
JA Taillon, RF Devers, RL Plante, MW Newrock, JW Lau, G GreeneMicroscopy and Microanalysis 25 (S2), 140-141, 2019201
3
2019
Teaching an Old Material New Tricks: Easy and Inexpensive Focused Ion Beam (FIB) Sample Protection Using Conductive Polymers
JA Taillon, V Ray, LG Salamanca-RibaMicroscopy and Microanalysis 2 (4), 872-877, 2017201
3
2017
Advanced analytical microscopy at the nanoscale: Applications in wide bandgap and solid oxide fuel cell materials
JA TaillonUniversity of Maryland, College Park, 2016201
3
2016
Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using FIB/SEM and TEM
JA Taillon, C Pellegrinelli, Y Huang, E Wachsman, L Salamanca-RibaMicroscopy and Microanalysis 21, 2161, 2015201
3
2015

Referred From: https://scholar.google.com/citations?user=Lu4rvXgAAAAJ&hl=en

Cited by
Citations 555
h-index 10
i10-index 10
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